Sponsored by TC10

This tutorial will lead the audience through the proper process to use when characterizing a high-speed interconnect at frequencies up to 50 GHz. This characterization methodology is being captured in the IEEE P370 standards development project, and members of the P370 working group will be explaining how one would apply the future standard to a “real-world” characterization study. The discussion will cover details of how to meet the electrical requirements of a proper test fixture, how to verify that your de-embedding tool correctly subtracted the fixture’s contribution from the overall measured response, and how to verify the integrity of the measured, de-embedded S-parameters before using them in end-toend link models.

Co-chairs:

Heidi Barnes, Keysight Technologies, Santa Rosa, California, USA

Mikheil Tsiklauri, Missouri University of Science and Technology, Rolla, Missouri, USA

PLANNED SPEAKERS AND TOPICS

Brief Overview of the Purpose and Scope of P370

Samuel Connor, IBM Corporation, Raleigh, North Carolina, USA

Xiaoning Ye, Intel Corporation, Hillsboro, Oregon, USA 

Design Considerations and Acceptance Criteria for Test Fixtures

Heidi Barnes, Keysight Technologies, Santa Rosa, California, USA

Verification of a De-embedding Algorithm and Process, and Some Consistency Tests

Eric Bogatin, Teledyne LeCroy, Longmont, Colorado, USA

Verification of S-Parameter Integrity

Mikheil Tsiklauri, Missouri University of Science and Technology, Rolla, Missouri, USA

Summary of overall process and open discussion with the audience

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